- 12 Parallel SPC-150NX Modules in 19″ Case
- High-Throughput Rate
- No Crosstalk Between Channels
- Excellent Time Resolution
- Internal Timing Jitter 1.6 ps RMS (3.5 ps FWHM)
- Minimum Time Channel Width 407 ps
- Ultra-High IRF Stability
- Input Discriminator Bandwidth 4 GHz
- Saturated Count Rate 10 MHz per Channel
Specifications
Photon Channel |
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Principle |
Constant Fraction Discriminator (CFD) |
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Discriminator Input Bandwidth |
4 GHz |
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Time Resolution (FWHM/RMS, electr.) |
< 3.5 ps / 1.6 ps |
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Variance in Time of IRF centroid |
< 0.4 ps RMS over 100 s |
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Optimum Input Voltage Range |
-30 mV to -500 mV |
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Min. Input Pulse Width |
200 ps |
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Threshold |
0 to -250 mV |
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Zero Cross Adjust |
-100 mV to 100 mV |
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Synchronisation Channel |
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Principle |
Constant Fraction Discriminator (CFD) |
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Discriminator Input Bandwidth |
4 GHz |
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Optimum Input Voltage Range |
-30 mV to -500 mV |
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Min. Input Pulse Width |
200 ps |
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Threshold |
0 to -250 mV |
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Frequency Range |
0 to 150 MHz |
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Frequency Divider |
1, 2, 4 |
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Zero Cross Adjust |
-100 mV to 100 mV |
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Time-to-Amplitude Converters / ADCs |
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Principle |
Ramp Generator / Biased Amplifier |
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TAC Range |
25 ns to 2.5 µs |
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Biased Amplifier Gain |
1 to 15 |
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Biased Amplifier Offset |
0 % to 50 % of TAC Range |
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Time Range incl. Biased Amplifier |
1.67 ns to 2.5 µs |
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Min. Time Channel Width |
407 fs |
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ADC Principle |
50 ns Flash ADC with Error Correction |
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Diff. Nonlinerarity |
< 0.5 % RMS, typ. < 1 % peak-peak |
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Data Acquisition |
Histogram Mode |
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Method |
on-board multi-dim. histogramming process |
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Dead Time |
100 ns, independent of computer speed |
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Saturated Count Rate (Each Channel) |
10 MHz |
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Useful Count Rate (Each Channel) |
5 MHz |
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Max. Counts / Time Channel |
16 bits |
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Overflow Control |
none, stop, repeat and correct |
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Collection Time |
0.1 µs to 100,000 s |
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Diplay Interval Time |
10 ms to 100,000 s |
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Repeat Time |
0.1 µs to 100,000 s |
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Sequencing Recording |
Programmable Hardware Sequencer, unlimited recording by Memory swapping, in curve mode and scan mode |
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Synchronisation with Scanning |
Pixel, Line and Frame from Scanning Device |
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Routing |
7 bit, TTL |
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Experiment Trigger |
TTL |
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Data Acquisition |
FIFO / Parameter-Tag Mode |
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Method |
Time and wavelength tagging of individual photons and continuous writing to disk |
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Online Display |
Decay functions, FCS, Cross-FCS, PCH MCS Traces |
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FCS Calculation |
Multi-tau algorithm, online calculation and online fit |
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Number of counts of decay/ waveform recording |
unlimited |
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Dead Time |
100 ns |
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Saturated Count Rate, Peak (Each Channel) |
10 MHz |
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Max. Counts / Time Channel (Counting Depth) |
unlimited |
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Output Data Format (ADC / Macrotime / Routing) |
12 / 12 / 4 |
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FIFO Buffer Capacity (Photons) |
2 * 106 |
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Macro Timer Resolution, Internal Clock |
50 ns, 12 bit, overflows marked by MOTF entry in data stream |
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Input Macro Timer Resolution, Clock from Sync |
10 ns to 100 ns, 12 bit, overflow marked by MOTF entry in data stream |
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Input Curve Control (external Routing) |
4 bit, TTL |
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External Event Markers |
4 bit, TTL |
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Enable Count Control |
1 bit, TTL |
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Input Experiment Trigger |
TTL |
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Computer Interface |
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Principle | High-Speed Parallel Interface |